Passivation of Metals and Semiconductors, and Properties of Thin Oxide Layers: A Selection of Papers from the 9th International Symposium, Paris, France, 27 June - 1 July 2005Philippe Marcus, Vincent Maurice Passivation of Metals and Semiconductors, and Properties of Thin Oxide Layers contains a selection of papers presented at PASSIVITY-9, the 9th International Symposium on the Passivation of Metals and Semiconductors and the Properties of Thin Oxide Layers, which was held in Paris, 27 June - 1 July, 2005. One hundred and twelve peer-reviewed manuscripts have been included. The book covers all the fundamental and applied aspects of passivity and provides a relevant and updated view of the advances and new trends in the field. It is structured in ten sections: • Growth, (Nano)structure and Composition of Passive Films • Passivity of Semiconductors • Electronic Properties of Passive Films • Passivity Issues in Biological Systems • Passivity in High-Temperature Water • Mechanical Properties of Passive Films,• Passivity Issues in Stress Corrosion Cracking and Tribocorrosion • Passivity Breakdown and Localized Corrosion • Modeling and Simulation • Surface Modifications and Inhibitors (for Improved Corrosion Resistance and/or Adhesion) |
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Results 1-5 of 88
Page 6
... values after prolonged time. The depassivation pH, pHdp, depends on the Mo content of alloys and decreases with increasing Mo content. Since the depassivation is caused by the reductive dissolution of the passive film, the reductive ...
... values after prolonged time. The depassivation pH, pHdp, depends on the Mo content of alloys and decreases with increasing Mo content. Since the depassivation is caused by the reductive dissolution of the passive film, the reductive ...
Page 33
... value from Figures 2 to 4 has been fixed in the fitting procedure. 6 0 1 2 3 4 5 6 0 1 2 3 4 5 10MHz 1 kHz 100Hz F c m ... values around 2 mF.cm–2, the charge carrier concentration results in the order of 1020 cm–3, value typically found ...
... value from Figures 2 to 4 has been fixed in the fitting procedure. 6 0 1 2 3 4 5 6 0 1 2 3 4 5 10MHz 1 kHz 100Hz F c m ... values around 2 mF.cm–2, the charge carrier concentration results in the order of 1020 cm–3, value typically found ...
Page 37
... value obtained after stabilization at the corresponding formation potential. After each signal the system was left polarized at formation potential until current recovered approximately to the starting value. Galvanostatic charging ...
... value obtained after stabilization at the corresponding formation potential. After each signal the system was left polarized at formation potential until current recovered approximately to the starting value. Galvanostatic charging ...
Page 45
... values are summarized in Figure 5. -100 5 -800 -700 -600 -500 -400 -300 -200 20 30 40 50 60 70 80 90 TEMPERATURE (oC) C O R R O S I O N P O TE N T IAL (mV ) EN 14591 EN 14562 Nickel EN 14311 EN 14429 0 0.5 1 1.5 2 2.5 3 3.5 4 4.5 20 40 ...
... values are summarized in Figure 5. -100 5 -800 -700 -600 -500 -400 -300 -200 20 30 40 50 60 70 80 90 TEMPERATURE (oC) C O R R O S I O N P O TE N T IAL (mV ) EN 14591 EN 14562 Nickel EN 14311 EN 14429 0 0.5 1 1.5 2 2.5 3 3.5 4 4.5 20 40 ...
Page 54
... values and trends (e.g., the corrosion potential decreases with increasing values of pH and temperature). Studies indicate that localized corrosion is initiated when the corrosion potential is above a critical potential; and that ...
... values and trends (e.g., the corrosion potential decreases with increasing values of pH and temperature). Studies indicate that localized corrosion is initiated when the corrosion potential is above a critical potential; and that ...
Contents
Section B Passivity of Semiconductors | 231 |
Section C Electronic Properties of Passive Films | 277 |
Section D Passivity Issues in Biological Systems | 349 |
Section E Passivity in HighTemperature Water | 395 |
Section F Mechanical Properties of Passive Films | 437 |
Section G Passivity Issues in Stress Corrosion Cracking and Tribocorrosion | 475 |
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Passivation of Metals and Semiconductors, and Properties of Thin Oxide ... Philippe Marcus No preview available - 2006 |
Common terms and phrases
acid Acta adsorption AISI alloys aluminium anodised aqueous austenitic B.V. All rights behaviour borate buffer solution capacitance cathodic cation chemical chloride chromium coating composition concentration copper corrosion potential corrosion resistance current density deaerated decrease depth profiles dissolution EDTA effect electrochemical impedance electrode electrolyte Elsevier B.V. experimental Figure formation galvanostatic growth hydroxide immersion increase interface ions iron Keywords kinetics localized corrosion Marcus materials Maurice Editors measurements mechanism Metals and Semiconductors NaCl nano-scratching NaOH nickel observed obtained oxygen Passivation of Metals passive film passive film formed passive layer peak photocurrent pitting pitting corrosion polarization curves potentiodynamic potentiostatic present Properties of Thin reaction repassivation rights reserved rust film samples shows specimens spectra spectroscopy sputtering stainless steel structure substrate surface tantalum temperature tests thickness Thin Oxide Layers titanium values VSCE X-ray X-ray photoelectron spectroscopy
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