Passivation of Metals and Semiconductors, and Properties of Thin Oxide Layers: A Selection of Papers from the 9th International Symposium, Paris, France, 27 June - 1 July 2005Philippe Marcus, Vincent Maurice Passivation of Metals and Semiconductors, and Properties of Thin Oxide Layers contains a selection of papers presented at PASSIVITY-9, the 9th International Symposium on the Passivation of Metals and Semiconductors and the Properties of Thin Oxide Layers, which was held in Paris, 27 June - 1 July, 2005. One hundred and twelve peer-reviewed manuscripts have been included. The book covers all the fundamental and applied aspects of passivity and provides a relevant and updated view of the advances and new trends in the field. It is structured in ten sections: • Growth, (Nano)structure and Composition of Passive Films • Passivity of Semiconductors • Electronic Properties of Passive Films • Passivity Issues in Biological Systems • Passivity in High-Temperature Water • Mechanical Properties of Passive Films,• Passivity Issues in Stress Corrosion Cracking and Tribocorrosion • Passivity Breakdown and Localized Corrosion • Modeling and Simulation • Surface Modifications and Inhibitors (for Improved Corrosion Resistance and/or Adhesion) |
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Results 1-5 of 81
Page 10
... samples exposed to high electron or photon irradiation at low oxygen pressures are known to preferentially oxidize under the beam area [8, 9]. Such damaging artifacts were reported in adsorption studies performed by AES with focused ...
... samples exposed to high electron or photon irradiation at low oxygen pressures are known to preferentially oxidize under the beam area [8, 9]. Such damaging artifacts were reported in adsorption studies performed by AES with focused ...
Page 11
... samples (pure metals, alloys and oxidized species). Software based on the Hofmann Sequential Layered Sputtering model [12] allows to provide concentration profiles and film thickness data [13]. Prior to ESO experiments, the sample ...
... samples (pure metals, alloys and oxidized species). Software based on the Hofmann Sequential Layered Sputtering model [12] allows to provide concentration profiles and film thickness data [13]. Prior to ESO experiments, the sample ...
Page 16
... samples of 7×7×2(mm3) in size. The surface of the samples was mechanically ground with 1000 grit of SiC paper and polished with diamond paste up to 1μm. Afterwards the samples were cleaned and degreased with ethanol in an ultrasonic ...
... samples of 7×7×2(mm3) in size. The surface of the samples was mechanically ground with 1000 grit of SiC paper and polished with diamond paste up to 1μm. Afterwards the samples were cleaned and degreased with ethanol in an ultrasonic ...
Page 17
... samples oxidized for different times at 400oC in air is presented in Fig. 1. The images were taken from the center of grains. There was no distinguishable change in the morphology until 60 seconds exposure (Fig. 1 (a)). Then the whisker ...
... samples oxidized for different times at 400oC in air is presented in Fig. 1. The images were taken from the center of grains. There was no distinguishable change in the morphology until 60 seconds exposure (Fig. 1 (a)). Then the whisker ...
Page 18
... samples oxidized for different times at 800°C are presented in Fig. 3 (a) to (d). Oxidation started with the ... samples oxidized at 400oC for different exposure times 120 (f) 300 Fig. 3. Morphology change during oxidation at 800oC Fig ...
... samples oxidized for different times at 800°C are presented in Fig. 3 (a) to (d). Oxidation started with the ... samples oxidized at 400oC for different exposure times 120 (f) 300 Fig. 3. Morphology change during oxidation at 800oC Fig ...
Contents
Section B Passivity of Semiconductors | 231 |
Section C Electronic Properties of Passive Films | 277 |
Section D Passivity Issues in Biological Systems | 349 |
Section E Passivity in HighTemperature Water | 395 |
Section F Mechanical Properties of Passive Films | 437 |
Section G Passivity Issues in Stress Corrosion Cracking and Tribocorrosion | 475 |
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Passivation of Metals and Semiconductors, and Properties of Thin Oxide ... Philippe Marcus No preview available - 2006 |
Common terms and phrases
acid Acta adsorption AISI alloys aluminium anodised aqueous austenitic B.V. All rights behaviour borate buffer solution capacitance cathodic cation chemical chloride chromium coating composition concentration copper corrosion potential corrosion resistance current density deaerated decrease depth profiles dissolution EDTA effect electrochemical impedance electrode electrolyte Elsevier B.V. experimental Figure formation galvanostatic growth hydroxide immersion increase interface ions iron Keywords kinetics localized corrosion Marcus materials Maurice Editors measurements mechanism Metals and Semiconductors NaCl nano-scratching NaOH nickel observed obtained oxygen Passivation of Metals passive film passive film formed passive layer peak photocurrent pitting pitting corrosion polarization curves potentiodynamic potentiostatic present Properties of Thin reaction repassivation rights reserved rust film samples shows specimens spectra spectroscopy sputtering stainless steel structure substrate surface tantalum temperature tests thickness Thin Oxide Layers titanium values VSCE X-ray X-ray photoelectron spectroscopy
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