Passivation of Metals and Semiconductors, and Properties of Thin Oxide Layers: A Selection of Papers from the 9th International Symposium, Paris, France, 27 June - 1 July 2005Philippe Marcus, Vincent Maurice Passivation of Metals and Semiconductors, and Properties of Thin Oxide Layers contains a selection of papers presented at PASSIVITY-9, the 9th International Symposium on the Passivation of Metals and Semiconductors and the Properties of Thin Oxide Layers, which was held in Paris, 27 June - 1 July, 2005. One hundred and twelve peer-reviewed manuscripts have been included. The book covers all the fundamental and applied aspects of passivity and provides a relevant and updated view of the advances and new trends in the field. It is structured in ten sections: • Growth, (Nano)structure and Composition of Passive Films • Passivity of Semiconductors • Electronic Properties of Passive Films • Passivity Issues in Biological Systems • Passivity in High-Temperature Water • Mechanical Properties of Passive Films,• Passivity Issues in Stress Corrosion Cracking and Tribocorrosion • Passivity Breakdown and Localized Corrosion • Modeling and Simulation • Surface Modifications and Inhibitors (for Improved Corrosion Resistance and/or Adhesion) |
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Results 1-5 of 29
Page 4
... potentiostatic control in 1 M HCl. All solutions were de-aerated by bubbling N2 gas for more than 3.6 ks. An Ag/AgCl (3.33 M KCl) reference electrode was used as a reference electrode. In the ellipsometric measurement, three-parameter ...
... potentiostatic control in 1 M HCl. All solutions were de-aerated by bubbling N2 gas for more than 3.6 ks. An Ag/AgCl (3.33 M KCl) reference electrode was used as a reference electrode. In the ellipsometric measurement, three-parameter ...
Page 10
... potentiostatic control at 0.3V/SCE in the same electrolyte during periods varying between 30 s and 112 h [2,7]. AES depth profiles were realized with a cylindrical mirror analyzer (Cameca OPC 105) and a co-axial electron gun (2.5 keV ...
... potentiostatic control at 0.3V/SCE in the same electrolyte during periods varying between 30 s and 112 h [2,7]. AES depth profiles were realized with a cylindrical mirror analyzer (Cameca OPC 105) and a co-axial electron gun (2.5 keV ...
Page 25
... potentiostatic control. Figure 3. Schematic mixed-potential diagram indicating the cathodic reactions for bare steel and for the steel with a nickel salt on its surface. Figure 5. XPS S-2p spectra from (a) active, (b) passive,. Passivity ...
... potentiostatic control. Figure 3. Schematic mixed-potential diagram indicating the cathodic reactions for bare steel and for the steel with a nickel salt on its surface. Figure 5. XPS S-2p spectra from (a) active, (b) passive,. Passivity ...
Page 26
... potentiostatic control at a series of potentials between the “peak” (at 0.0VMSE) and “spike” (at -0.6VMSE) potentials different subsequent behaviour was observed. In brief, when the pre-polarization was made for 1h at higher than -0.3 ...
... potentiostatic control at a series of potentials between the “peak” (at 0.0VMSE) and “spike” (at -0.6VMSE) potentials different subsequent behaviour was observed. In brief, when the pre-polarization was made for 1h at higher than -0.3 ...
Page 36
... Potentiostatic current transients during film formation were recorded for 900s at a step of 0.1 V from 0.3 to 0.9 V. The potential steps were taken, from -0.65 V to the formation potential, immediately following the pretreatment. Short ...
... Potentiostatic current transients during film formation were recorded for 900s at a step of 0.1 V from 0.3 to 0.9 V. The potential steps were taken, from -0.65 V to the formation potential, immediately following the pretreatment. Short ...
Contents
Section B Passivity of Semiconductors | 231 |
Section C Electronic Properties of Passive Films | 277 |
Section D Passivity Issues in Biological Systems | 349 |
Section E Passivity in HighTemperature Water | 395 |
Section F Mechanical Properties of Passive Films | 437 |
Section G Passivity Issues in Stress Corrosion Cracking and Tribocorrosion | 475 |
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Passivation of Metals and Semiconductors, and Properties of Thin Oxide ... Philippe Marcus No preview available - 2006 |
Common terms and phrases
acid Acta adsorption AISI alloys aluminium anodised aqueous austenitic B.V. All rights behaviour borate buffer solution capacitance cathodic cation chemical chloride chromium coating composition concentration copper corrosion potential corrosion resistance current density deaerated decrease depth profiles dissolution EDTA effect electrochemical impedance electrode electrolyte Elsevier B.V. experimental Figure formation galvanostatic growth hydroxide immersion increase interface ions iron Keywords kinetics localized corrosion Marcus materials Maurice Editors measurements mechanism Metals and Semiconductors NaCl nano-scratching NaOH nickel observed obtained oxygen Passivation of Metals passive film passive film formed passive layer peak photocurrent pitting pitting corrosion polarization curves potentiodynamic potentiostatic present Properties of Thin reaction repassivation rights reserved rust film samples shows specimens spectra spectroscopy sputtering stainless steel structure substrate surface tantalum temperature tests thickness Thin Oxide Layers titanium values VSCE X-ray X-ray photoelectron spectroscopy
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